机构:[1]Department of Otolaryngology, Southwest Hospital, Third Military Medical University, Gao Tan Yan Street, Shaping Ba District, Chongqing, 400038, China[2]Department of Head and Neck Surgery, David Geffen School of Medicine, University of California Los Angeles, Los Angeles, California 90095, USA[3]Department of Otolaryngology, First Affiliated Hospital of Kunming Medical University, Xichang road no. 295, Kunming, Yunnan, 650032, China外科科室耳鼻咽喉科昆明医科大学附属第一医院
Digit recognition was measured in quiet and in two noise conditions by English-native (EN) and Chinese-native (CN) listeners. EN listeners were tested using English digits and CN listeners were tested using both English and Chinese digits. In quiet, forward digit span recall worsened for both groups as the number of digits was increased. Significant effects of language experience were observed with five or more digits. Language experience had a significant effect on digit recognition in babble but not in steady noise. These results suggest that understanding of a nonnative language can be influenced by both cognitive load and listening environment.
基金:
Department of Otolaryngology in Southwest Hospital at Third Military Medical University in China; [NIDCD-R01-DC-004993]
第一作者机构:[1]Department of Otolaryngology, Southwest Hospital, Third Military Medical University, Gao Tan Yan Street, Shaping Ba District, Chongqing, 400038, China
通讯作者:
推荐引用方式(GB/T 7714):
Zhou Xiaoqing,Yuan Wei,Galvin John J.,et al.Influence of language experience on digit recognition by English and Chinese listeners[J].JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA.2015,138(3):EL324-EL328.doi:10.1121/1.4929617.
APA:
Zhou, Xiaoqing,Yuan, Wei,Galvin, John J.,Fu, Qian-Jie&Zhang, Ying.(2015).Influence of language experience on digit recognition by English and Chinese listeners.JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA,138,(3)
MLA:
Zhou, Xiaoqing,et al."Influence of language experience on digit recognition by English and Chinese listeners".JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA 138..3(2015):EL324-EL328